发明名称 Wafer drying methods of Marangoni type and apparatus suitable therefor
摘要 A wafer drying method includes submerging a wafer in a cleaning solution in a dry chamber. An organic liquid vapor from an organic liquid is supplied into the dry chamber at a first volumetric supply rate to form an organic liquid layer on a surface of the cleaning solution, the organic liquid layer having at least a prescribed concentration of the organic liquid. The organic liquid vapor is supplied into the dry chamber at a second volumetric supply rate that is lower than the first volumetric supply rate. During and/or following the supplying of the organic liquid vapor into the dry chamber, at least a portion of the wafer is removed from the cleaning solution through the organic liquid layer.
申请公布号 US6896743(B2) 申请公布日期 2005.05.24
申请号 US20020041227 申请日期 2002.01.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG JAE-HYUNG;KWON YOUNG-MIN;LEE JONG-JAE;JUNG DONG-HOON
分类号 H01L21/304;H01L21/00;(IPC1-7):B08B3/00;F26B3/06 主分类号 H01L21/304
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