| 摘要 |
A non-contacting mensuration system including a light source for projecting light on a target; an imager having an image plane; a first optical subsystem configured to project a first image of the light on the target onto a first portion of the image plane of the imager; and a second optical subsystem configured to project a second image of the light on the target onto a second portion of the image plane of the imager so that two different images are obtained from different aspects simultaneously.
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