| 摘要 |
A docking system ( 10 ) and method for docking a test head ( 16 ) of a device tester to a device handler. The docking system ( 10 ) has a handler plate ( 12 ) and a tester plate ( 14 ), respectively mountable to the device handler and the test head ( 16 ). The handler plate ( 12 ) has two conversion bars ( 18 a , 18 b). Each of the two conversion bars ( 18 a ,18 b) has two lateral protrusions ( 40 a ,40 b). The tester plate ( 140 has four slot mounts ( 26 a ,26 b ,26 c ,26 d), each with an escalating slot ( 50 ) that is laterally oriented for respective linear engagement with the lateral protrusions ( 40 a ,40 b) for the docking. The method involves making a quick alignment of the handler plate ( 12 ) to the tester plate ( 14 ) by inserting two pre-docking guide pins into ( 20 a ,20 b) two pin sockets ( 22 a ,22 b) and, thereafter, actuating one or both of two actuating cams ( 28 a ,28 b) for the respective linear engagement.
|
