发明名称 Etching gas composition for silicon oxide and method of etching silicon oxide using the same
摘要 Disclosed are an etching gas composition for etching silicon oxide and a method of etching silicon oxide using the same. The etching gas composition for etching silicon oxide consists essentially of a carbon fluoride gas, in which the ratio of fluorine atoms relative to carbon atoms is less than 2, and an auxiliary fluorohydrocarbon gas comprising hydrogen, fluorine and carbon atoms. Silicon oxide is etched efficiently and precisely by utilizing a plasma of the etching gas composition. The etching selectivity of an oxide layer formed of silicon oxide with respect to photoresisit is thereby increased. Even when a thin photoresist layer wherein solubility into water changes by a light having DUV wavelength is applied, a contact hole having a high aspect ratio and a good profile can be manufactured using the etching compositions and methods of the present invention.
申请公布号 US6897153(B2) 申请公布日期 2005.05.24
申请号 US20010993832 申请日期 2001.11.06
申请人 SAMSUNG ELECTRONICS, CO., LTD. 发明人 KWEAN SUNG-UN;HWANG JAE-SEUNG
分类号 H01L21/28;H01L21/302;H01L21/306;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/302;C09K13/00;C09K13/06 主分类号 H01L21/28
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