发明名称 High deposition rate sputtering
摘要 Methods and apparatus for high-deposition sputtering are described. A sputtering source includes an anode and a cathode assembly that is positioned adjacent to the anode. The cathode assembly includes a sputtering target. An ionization source generates a weakly-ionized plasma proximate to the anode and the cathode assembly. A power supply produces an electric field between the anode and the cathode assembly that creates a strongly-ionized plasma from the weakly-ionized plasma. The strongly-ionized plasma includes a first plurality of ions that impact the sputtering target to generate sufficient thermal energy in the sputtering target to cause a sputtering yield of the sputtering target to be non-linearly related to a temperature of the sputtering target.
申请公布号 US6896773(B2) 申请公布日期 2005.05.24
申请号 US20020065739 申请日期 2002.11.14
申请人 ZOND, INC. 发明人 CHISTYAKOV ROMAN
分类号 C23C14/32;C23C14/35;H01J37/34;(IPC1-7):C23C14/35 主分类号 C23C14/32
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