| 摘要 |
The invention relates to a method for calibrating a layer thickness measuring machine for products (10), comprising electrically conducting inserts (2) that are arranged in a substantially periodical manner and that are coated with or embedded in an electrically non-conducting material. An eddy current sensor (1) is displaced relative to the product (10) at a predetermined distance thereto. The layer thickness (SD) is determined from the difference of the distance of the eddy current sensor (1) to the product (10) and the measured distance to the inserts (2). The aim of the invention is to provide a simplified method for calibrating a layer thickness measuring machine of the aforementioned type. According to the invention, the distances (A) of the inserts (2) relative one another are determined by means of the eddy current sensor (1) and the layer thickness value (SD) is calibrated with an associated calibration value (K) in accordance with the distances (A) of the inserts (2). |
