发明名称 FinFETs having first and second gates of different resistivities, and methods of fabricating the same
摘要 A fin field effect transistor (FinFET) includes a first gate and a second gate. The first gate has a vertical part that is defined by sidewalls of a silicon fin and sidewalls of a capping pattern disposed on the silicon fin and a horizontal part horizontally extends from the vertical part. The second gate is made of a low-resistivity material and is in direct contact with the horizontal part of the first gate. A channel may be controlled due to the first gate, and a device operating speed may be enhanced due to the second gate. Related fabrication methods also are described.
申请公布号 US2005104096(A1) 申请公布日期 2005.05.19
申请号 US20040937246 申请日期 2004.09.09
申请人 LEE DEOK-HYUNG;LEE BYEONG-CHAN;CHOI SI-YOUNG;JUNG IN-SOO 发明人 LEE DEOK-HYUNG;LEE BYEONG-CHAN;CHOI SI-YOUNG;JUNG IN-SOO
分类号 H01L21/28;H01L21/335;H01L21/336;H01L21/8238;H01L29/41;H01L29/423;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L21/332;H01L21/823;H01L29/76;H01L31/062 主分类号 H01L21/28
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