发明名称 |
Programmable system for device testing and control |
摘要 |
A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
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申请公布号 |
US2005107976(A1) |
申请公布日期 |
2005.05.19 |
申请号 |
US20040874969 |
申请日期 |
2004.06.23 |
申请人 |
KLIJN AARON C.;MILLER MARVIN G.;PATARO FRANCISCO J.;WILLETT MICHAEL D. |
发明人 |
KLIJN AARON C.;MILLER MARVIN G.;PATARO FRANCISCO J.;WILLETT MICHAEL D. |
分类号 |
G01R31/28;G01R31/327;G06F19/00;(IPC1-7):G06F19/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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