发明名称 Plasma processing system
摘要 A power segmented electrode useful as part of an upper electrode and/or substrate support for supporting a substrate such as a semiconductor wafer in a plasma reaction chamber such as a single wafer etcher. The power segmented electrode includes a plurality of electrodes which are supplied radiofrequency power in a manner which provides uniform processing of the substrate. The power to the electrodes can be supplied through a circuit incorporating interelectrode gap capacitance, one or more variable capacitors, one or more current sensors, a power splitter, one or more DC biasing sources, and/or power amplifier.
申请公布号 KR100490781(B1) 申请公布日期 2005.05.19
申请号 KR20047003858 申请日期 1996.06.20
申请人 发明人
分类号 H01L21/3065;H05H1/46;H01J37/32;H01L21/302;H01L21/683;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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