METHOD FOR VERIFYING CHIP HAVING DIVERSE FUNCTIONS WITH INTERNAL STATE TRACE COMPARISON,申请号KR19970077919-传众专利搜索

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发明名称	METHOD FOR VERIFYING CHIP HAVING DIVERSE FUNCTIONS WITH INTERNAL STATE TRACE COMPARISON
摘要
申请公布号	KR100492007(B1)	申请公布日期	2005.05.19
申请号	KR19970077919	申请日期	1997.12.30
申请人	MAGNACHIP SEMICONDUCTOR, LTD.	发明人	BAE, JONG HONG;JIN, TAE HUN
分类号	G01R31/3187;(IPC1-7):G06F9/22	主分类号	G01R31/3187
代理机构		代理人
主权项
地址

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