发明名称 POLYMERIC COMPOUND, RESIST MATERIAL, AND METHOD FOR PATTERN FORMATION
摘要 <P>PROBLEM TO BE SOLVED: To obtain a new fluoropolymeric compound excellent in transparency to radiations of &le;200 nm wavelength, especially &le;160 nm wavelength, adhesion to substrate, affinity for developing liquid, dry etching resistance, or the like, thus useful as a base resin for radiation-sensitive resists. <P>SOLUTION: The polymeric compound has a weight-average molecular weight of 1,000-500,000 and comprises recurring units each having a partial structure represented by formula(1) ( wherein, R<SP>1</SP>is a single bond or a 1-20C straight-chain, branched or cyclic alkylene or fluoroalkylene group; and R<SP>2</SP>and R<SP>3</SP>are each H or a 1-20C straight-chain, branched or cyclic alkyl or fluoroalkyl group, wherein at least one of R<SP>2</SP>and R<SP>3</SP>contains one or more fluorine atoms ). <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005126558(A) 申请公布日期 2005.05.19
申请号 JP20030363134 申请日期 2003.10.23
申请人 SHIN ETSU CHEM CO LTD;MATSUSHITA ELECTRIC IND CO LTD;CENTRAL GLASS CO LTD 发明人 HARADA YUJI;HATAKEYAMA JUN;KAWAI YOSHIO;SASAKO MASARU;ENDO MASATAKA;KISHIMURA SHINJI;MAEDA KAZUHIKO;KOMORIYA HARUHIKO;YAMANAKA KAZUHIRO
分类号 C08G61/02;C08F16/26;C08F20/28;C08F32/08;C08F220/24;G03C1/10;G03C1/76;G03F7/004;G03F7/039;H01L21/027 主分类号 C08G61/02
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