发明名称 Magnetic tunneling junction cell having free magnetic layer with low magnetic moment and magnetic random access memory having the same
摘要 <p>A magnetic tunneling junction(MTJ) cell including a free magnetic layer having a low magnetic moment and a magnetic random access memory (MRAM) comprising the MTJ cell are provided. The MTJ cell of the MRAM includes: a lower electrode (10); and a lower magnetic layer (12, 14, 16), a tunneling layer (18), an upper magnetic layer (20) and an upper electrode, which are sequentially stacked on the lower electrode. The upper magnetic layer includes a free magnetic layer of 5 nm or less in thickness. The MTJ cell may have an aspect ratio of 2 or less and the free magnetic layer may have a magnetic moment of 800 emu/cm&lt;3&gt; or less. &lt;IMAGE&gt;</p>
申请公布号 EP1531481(A2) 申请公布日期 2005.05.18
申请号 EP20040257001 申请日期 2004.11.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, TAE-WAN;PARK, SANG-JIN;HWANG, IN-JUN
分类号 H01L27/105;G11C11/15;G11C11/16;H01F10/13;H01F10/32;H01L21/8246;H01L43/08;(IPC1-7):G11C11/16 主分类号 H01L27/105
代理机构 代理人
主权项
地址