发明名称 |
Magnetic tunneling junction cell having free magnetic layer with low magnetic moment and magnetic random access memory having the same |
摘要 |
<p>A magnetic tunneling junction(MTJ) cell including a free magnetic layer having a low magnetic moment and a magnetic random access memory (MRAM) comprising the MTJ cell are provided. The MTJ cell of the MRAM includes: a lower electrode (10); and a lower magnetic layer (12, 14, 16), a tunneling layer (18), an upper magnetic layer (20) and an upper electrode, which are sequentially stacked on the lower electrode. The upper magnetic layer includes a free magnetic layer of 5 nm or less in thickness. The MTJ cell may have an aspect ratio of 2 or less and the free magnetic layer may have a magnetic moment of 800 emu/cm<3> or less. <IMAGE></p> |
申请公布号 |
EP1531481(A2) |
申请公布日期 |
2005.05.18 |
申请号 |
EP20040257001 |
申请日期 |
2004.11.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, TAE-WAN;PARK, SANG-JIN;HWANG, IN-JUN |
分类号 |
H01L27/105;G11C11/15;G11C11/16;H01F10/13;H01F10/32;H01L21/8246;H01L43/08;(IPC1-7):G11C11/16 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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