发明名称 LDMOS transistor capable of attaining high withstand voltage with low on-resistance and having a structure suitable for incorporation with other MOS transistors
摘要 A semiconductor device, methods for manufacturing the semiconductor device, and an integrated circuit including the semiconductor device are disclosed. The semiconductor device includes an LDMOS transistor and a MOS transistor, both formed simultaneously on a same substrate. The gate electrodes and the gate oxide layers of the LDMOS and the MOS are formed independently from one another. The source and drain regions of the LDMOS and the MOS are respectively formed in a self-aligned manner. In this way, the LDMOS and the MOS can be formed, in an effective manner, while sustaining the respective desired characteristics.
申请公布号 US6894350(B2) 申请公布日期 2005.05.17
申请号 US20040897089 申请日期 2004.07.23
申请人 RICOH COMPANY, LTD. 发明人 SHIMIZU AKIRA;NEGORO TAKAAKI
分类号 H01L29/78;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/94;(IPC1-7):H01L29/76;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/78
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