发明名称 P channel Rad Hard MOSFET with enhancement implant
摘要 A P channel vertical conduction Rad Hard MOSFET has a plurality of closely spaced base strips which have respective sources to form invertible surface channels with the opposite sides of each of the stripes. A non-DMOS late gate oxide and overlying conductive polysilicon gate are formed after the source and base regions have been diffused. The base stripes are spaced by about 0.6 microns, and the polysilicon gate stripes are about 3.2 microns wide. A P type enhancement region is implanted through spaced narrow windows early in the process and are located in the JFET common conduction region which is later formed by and between the spaced base stripes. The device is a high voltage (greater than 25 volts) P channel device with very low gate capacitance and very low on resistance.
申请公布号 US6894345(B2) 申请公布日期 2005.05.17
申请号 US20020205125 申请日期 2002.07.23
申请人 INTERNATIONAL RECTIFIER CORPORATION 发明人 BODEN, JR. MILTON J.
分类号 H01L21/336;H01L29/08;H01L29/78;(IPC1-7):H01L29/76;H01L29/94 主分类号 H01L21/336
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