Preconditional quiescent current testing of a semiconductor device

摘要

A method for testing a semiconductor device is included where sleep mode commands associated with the semiconductor device are generated. The semiconductor device includes logic blocks, where a sleep mode command sets a logic block in a sleep mode. A sleep mode sequence associated with the logic blocks of the semiconductor device is determined. The sleep mode commands are executed according to the sleep mode sequence by applying the sleep mode commands to the logic blocks. A quiescent current corresponding to the semiconductor device is measured in order to test the semiconductor device.