发明名称 Burn-in carrier for a semiconductor die
摘要 A method of using adhesive tape to temporarily retain a die being temporarily held in a fixture during testing and burn-in. The method of the present invention uses a die cut piece of adhesively coated tape to hold a die in a test and burn-in fixture. Upon subsequent heating of the tape beyond the normal operating range of the adhesive coating on the tape, the die is removed from the tape, the tape is removed from the test and burn-in fixture, and the remaining adhesive, if any, is removed from the test and burn-in fixture.
申请公布号 US6894521(B2) 申请公布日期 2005.05.17
申请号 US20030395923 申请日期 2003.03.24
申请人 MICRON TECHNOLOGY, INC. 发明人 MODEN WALTER L.;JACOBSON JOHN O.
分类号 G01R1/04;G01R31/26;H01L21/44;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R1/04
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