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发明名称
非挥发性记忆体及其制造方法
摘要
一种非挥发性记忆体的制造方法,此方法系先提供基底。于此基底上形成穿隧介电层后,进行高密度电浆化学气相沈积制程,于穿隧介电层上形成电荷陷入层。接着,于电荷陷入层上形成阻挡介电层,并于阻挡介电层上形成闸极。然后,于闸极两侧之基底中形成源极/汲极区。
申请公布号
TW200516721
申请公布日期
2005.05.16
申请号
TW092130677
申请日期
2003.11.03
申请人
国立中山大学
发明人
张鼎张;颜硕廷;刘柏村;陈纪文;蔡宗鸣;戴亚翔;施敏
分类号
H01L21/8247
主分类号
H01L21/8247
代理机构
代理人
詹铭文;萧锡清
主权项
地址
高雄市鼓山区莲海路70号
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