Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies

摘要

In a method for testing continuity of electrical paths through a connector, pairs of contacts of the connector are coupled via a first plurality of passive circuit components. The contacts are also coupled to a test sensor port via a second plurality of passive circuit components, ones of which are coupled in parallel to the test sensor port. The method proceeds with stimulating one or more nodes of the connector, and then measuring an electrical characteristic via the test sensor port. Finally, the measured electrical characteristic is compared to at least one threshold to assess continuities of at least two electrical paths through the connector.