发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain a method for manufacturing a semiconductor device capable of improving the adhesive properties of a diffusion preventive film and a metallic film. SOLUTION: The manufacturing method for the semiconductor device has a process in which the diffusion preventive film composed of a metallic nitride is formed on a semiconductor substrate by a vapor film-formation method, the process in which a metallic adhesive film composed of a metal or a metallic compound is formed on the diffusion preventive film by the vapor film-formation method, and the process in which a metallic film composed of the metal or the metallic compound is formed on the metallic adhesive film. A film having adhesive properties with the metallic film higher than those of the diffusion preventive film and the metallic film is used as the metallic adhesive film. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005123281(A) 申请公布日期 2005.05.12
申请号 JP20030354493 申请日期 2003.10.15
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 OTSUKA NOBUYUKI;FURUYA AKIRA
分类号 C23C16/44;H01L21/28;H01L21/285;H01L21/3205;H01L23/52;(IPC1-7):H01L21/320 主分类号 C23C16/44
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