| 摘要 |
A method is proposed for the spatially-resolved determination of the concentration of n elements and/or element combinations in an object to be examined that includes these elements and/or element combinations. In the method, use is made of an X-ray installation to record a number of digital X-ray images of at least one region of the object to be examined with the aid of m>=n different spectral distributions of the X-radiation S(E) and/or of the detector sensitivity D(E), in order to obtain m attenuation values for each pixel representing the same location in the X-ray images. The concentrations of the n elements and/or element combinations are then calculated for at least one pixel from the respective m attenuation values while taking account of known spectral absorption spectra of the n elements and/or element combinations and of the m different spectral distributions of the X-radiation and/or of the detector sensitivity.
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