发明名称 |
Method and apparatus for wafer level testing of integrated optical waveguide circuits |
摘要 |
A method of testing a planar lightwave circuit is achieved by coupling an optical probe to the planar lightwave circuit. In one embodiment, a second probe is used in combination with the first probe to test the planar lightwave circuit by sending and receiving a light beam through the planar lightwave circuit.
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申请公布号 |
US2005100266(A1) |
申请公布日期 |
2005.05.12 |
申请号 |
US20040994021 |
申请日期 |
2004.11.19 |
申请人 |
NIKONOV DMITRI E.;MCCORMACK MARK T. |
发明人 |
NIKONOV DMITRI E.;MCCORMACK MARK T. |
分类号 |
G01M11/00;(IPC1-7):G02B6/12 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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