发明名称 METHOD AND APPARATUS FOR INSPECTING MOUNTED COMPONENT, AND FIXTURE SUBSTRATE THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide an easy method and a simple apparatus for inspecting mounted components, which are used for measuring mount accuracy of a chip component, and to provide a fixture substrate suitable for the measurement. <P>SOLUTION: In the method for inspecting the mounted components, which measures the mount accuracy of the chip component 10 being mounted on the jig substrate 1 where a prescribed planar pattern is formed thereon, by using an electronic component mounting apparatus, the fixture substrate 1 is set in the visual field of a camera with a monitor, and the mounted chip component 10 is displayed on the monitor, and a planar pattern model 11 for measuring the accuracy and a chip component model 12 are displayed on a display device of a computer, and the chip component model is moved by an operator so as to correspond to a real image which is displayed in magnified fashion on the monitor of the camera, and deviation values of the chip component model 12 from the planar pattern model 11 are computed and stored to a memory of the computer. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005121478(A) 申请公布日期 2005.05.12
申请号 JP20030356481 申请日期 2003.10.16
申请人 HITACHI HIGH-TECH INSTRUMENTS CO LTD 发明人 KIMURA KOJIRO
分类号 G01B11/00;G01N21/956;G06T1/00;G06T5/50;H05K13/08 主分类号 G01B11/00
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