| 摘要 |
<P>PROBLEM TO BE SOLVED: To prevent a decrease in measurement precision of slit light (false slit light) projection type three-dimensional measuring device, and to facilitate miniaturization of the device. <P>SOLUTION: When there is disorder of the distribution of pixels whose detected luminous intensity values exceed a threshold value in a region A, a detected position C3 found from the weighted average of the brightness values of pixels selected by a threshold condition along a scanning line which crosses a luminous part image, is excluded from data to be used for three-dimensional measurement, since it easily gets out of a correct detection position line B-B, and detected positions C1, C2 obtained according to a scanning line where the number of detected pixels in an adequate range is obtained are adopted. The adequate range is Nav xαmin to Nav xαmax or Nav-β to Nav+γ, for example. Here, Nav represents an average detected pixel number concerning the scanning line where at least one pixel which gives a detected luminous intensity exceeding the threshold value is detected, and αmin, αmax, β, and γ represent a minimum adequate ratio, a maximum adequate ratio, a subtraction pixel number and an addition pixel number set beforehand by parameters respectively. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
