发明名称 TEMPERATURE TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a temperature test device having a structure that a test bath is equipped with an opening and capable of favorably controlling temperature in the test bath in a relatively wide setting temperature range. SOLUTION: The temperature test device 1 has the test bath 3 with the opening 10. Air curtains A1 and A2 are formed at the opening 10 by a first circulation route 21a, a second circulation route 21b and fans 27a and 27b. A control part 30 controls a first cooling part 12a and a second cooling part 12b and a heater 4. When controlling these, the control part 30 controls operation/non-operation of these according to cooling part control rules which specifies operation/non-operation of the first cooling part 12a and the second cooling part 12b based on a setting temperature SV or an in-bath temperature PV. In addition, the plurality of cooling part control rules (a first to a third cooling part control rules) are specified according to a differenceΔbetween the setting temperature SV and the in-bath temperature PV. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005121256(A) 申请公布日期 2005.05.12
申请号 JP20030353952 申请日期 2003.10.14
申请人 TAKAMISAWA CYBERNETICS CO LTD;TAKAMISAWA MEKKUSU:KK 发明人 TSUCHIDA NAOFUMI;MINOWA YOSHIKAZU;INADERA MASAYOSHI
分类号 G01R31/00;F24F5/00;G01N25/00;(IPC1-7):F24F5/00 主分类号 G01R31/00
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