发明名称 Semiconductor wafer dividing method
摘要 A method of dividing a semiconductor wafer comprising semiconductor chips which are composed of a laminate consisting of an insulating film and a functional film formed on the front surface of a semiconductor substrate and which are sectioned by streets, into individual semiconductor chips by cutting the semiconductor wafer with a cutting blade along the streets, the method comprising a first groove forming step for forming a pair of first laser grooves in the laminate by applying a first laser beam to each of the streets at a distance wider than the width of the cutting blade; a second groove forming step for forming second laser grooves which reach the semiconductor substrate between the both outer sides of the pair of first laser grooves in the street by applying a second laser beam to the laminate of a region wider than the width of the cutting blade; and a cutting step for cutting the semiconductor substrate with the cutting blade along the second laser grooves.
申请公布号 US2005101108(A1) 申请公布日期 2005.05.12
申请号 US20040981523 申请日期 2004.11.05
申请人 GENDA SATOSHI;NAKAMURA MASARU 发明人 GENDA SATOSHI;NAKAMURA MASARU
分类号 H01L21/301;B23K26/40;H01L21/00;H01L21/46;H01L21/78;(IPC1-7):H01L21/301 主分类号 H01L21/301
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