发明名称 Insulated gate field effect semiconductor devices and method of manufacturing the same
摘要 An LDD structure is manufactured to have a desired aspect ratio of the height to the width of a gate electrode. The gate electrode is first deposited on a semiconductor substrate followed by ion implantation with the gate electrode as a mask to form a pair of impurity regions. The gate electrode is then anodic oxidized to form an oxide film enclosing the electrode. With the oxide film as a mask, highly doped regions are formed by ion implantation in order to define lightly doped regions between the highly doped regions and the channel region located therebetween.
申请公布号 US2005098782(A1) 申请公布日期 2005.05.12
申请号 US20040939969 申请日期 2004.09.14
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;TAKEMURA YASUHIKO;ZHANG HONGYONG
分类号 H01L29/78;G02F1/1362;H01L21/265;H01L21/336;H01L21/60;H01L21/77;H01L21/84;H01L27/12;H01L29/04;H01L29/49;H01L29/786;(IPC1-7):H01L29/04;H01L29/10;H01L31/036;H01L31/037 主分类号 H01L29/78
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