| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a compact two-dimensional image element capable of real-time measurement of electromagnetic radiation and easy installation in a device, as well as an image detecting device and X-ray-analysis device using the two-dimensional image elements. <P>SOLUTION: The two-dimensional image element 10 composed of such a semiconductor as silicon having sensitivity to electromagnetic radiation comprises two or more strip semiconductor detecting elements 100 and two or more strip semiconductor detecting elements 200 having also sensitivity to electromagnetic radiation which are adjoined mutually and arranged in parallel, intersecting orthogonally with the upper surface of the semiconductor detecting element 100. Many sensing parts 300 are formed in the flat surface by the overlap area of these semiconductor detecting elements 100 and 200. The X-ray which enters into sensing parts 300 is changed into electric signal by the upper (Y-axis) semiconductor detecting element 200, generating fluorescent X ray and is changed into electric signal by semiconductor detecting element 100 of a lower layer (X-axis). <P>COPYRIGHT: (C)2005,JPO&NCIPI |
