Test pin for electrical or electronic components, has test head and contact pin that make connection at several contact points, and flexible contact elements, e.g. wire springs, lamellas or similar in bush

摘要

The test pin has a test head (2) movable in a housing (1) against the force of a force storage device and that interacts with a connecting pin (3). The test head and connecting pin make a connection at several contact points. Flexible contact elements, e.g. wire springs, lamellas or similar are arranged in a bush. The connecting pin engages the test head bush with a pin and a plug pin protrudes from a center part of the connecting pin on the opposite end. An independent claim is also included for the following: (a) a test head for a test pin.