发明名称 Semiconductor device and method of manufacturing the same
摘要 A simple technique of forming a low-resistant wire is provided in place of a Damascene method. In a three-layer wire composed of a first layer metal film wire, a second layer metal film wire that has fixed side etching portions, and an insulating film pattern, a low-resistant metal such as copper or silver is deposited in concave regions corresponding to the side etching portions of the second layer metal film wire through electrodeposition by electroplating. The above process is applied to a gate electrode and wire of a semiconductor device to obtain a semiconductor device that has high operation speed.
申请公布号 US6891270(B2) 申请公布日期 2005.05.10
申请号 US20020245701 申请日期 2002.09.18
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SUGAWARA AKIRA;TANAKA NOBUHIRO;UEHARA ICHIRO
分类号 H01L21/28;H01L21/288;H01L21/3205;H01L21/768;H01L21/77;H01L21/8238;H01L21/84;H01L23/52;H01L27/092;H01L27/12;H01L29/423;H01L29/43;H01L29/45;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L23/48;H01L23/40 主分类号 H01L21/28
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