发明名称 |
Dynamic maintenance of manufacturing system components |
摘要 |
A method and an apparatus for sorting between actual and perceived errors related to processing of semiconductor wafers. A plurality of semiconductor wafers are processed. Fault data relating to the processed semiconductor wafers is acquired. A trend associated with the fault data is determined. A determination is made whether the fault data relates to an actual fault associated with the semiconductor wafers or to a calibration error, based upon the trend. A component is notified of the calibration error in response to the determination that the fault data relates to the calibration error.
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申请公布号 |
US6890773(B1) |
申请公布日期 |
2005.05.10 |
申请号 |
US20020126860 |
申请日期 |
2002.04.19 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
STEWART EDWARD C. |
分类号 |
H01L21/66;(IPC1-7):H01L21/66;H01L23/58;G06F19/00 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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