发明名称 Method for making a semiconductor device having a metal gate electrode
摘要 A method for making a semiconductor device is described. That method comprises forming a dielectric layer on a substrate, and forming an impurity containing metal layer on the dielectric layer. A metal gate electrode is then formed from the impurity containing metal layer. Also described is a semiconductor device that comprises a metal gate electrode that is formed on a dielectric layer, which is formed on a substrate. The metal gate electrode includes a sufficient amount of an impurity to shift the workfunction of the metal gate electrode by at least about 0.1 eV.
申请公布号 US6890807(B2) 申请公布日期 2005.05.10
申请号 US20030431166 申请日期 2003.05.06
申请人 INTEL CORPORATION 发明人 CHAU ROBERT;DOCZY MARK;KUHN MARKUS
分类号 H01L21/28;H01L21/8238;H01L29/51;(IPC1-7):H01L21/823 主分类号 H01L21/28
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