SPECIMEN ANALYSIS METHOD AND SPECIMEN ANALYSIS DEVICE

摘要

A specimen analysis method and a specimen analysis device for analyzing a specimen by utilizing a double integral circuit (11) outputting a physical quantity correlated to an output from an analyzing instrument (2). Time intervals between the start of the input of the output from the analyzing instrument (2) to the double integral circuit (11) and the start of the output of the physical quantity from the double integral circuit (11) obtained before and after it is confirmed that the specimen is supplied to the analyzing instrument (2) are differentiated from each other.