发明名称 METHOD OF INSPECTING UNEVENNESS OF PARTITION SURFACE OF HONEYCOMB STRUCTURE AND INSPECTING DEVICE
摘要 <p>A method of inspecting the unevenness of the partition surface of a honeycomb structure comprising the steps of allowing a diffusion light to enter from the one end surface (8) side of a honeycomb structure (2) by a lighting means (3) and to exit from the other end surface (9) side after passing it through the inside of cells, allowing the exited diffusion light to pass through a translucent screen (4) disposed on the other end surface (9) side of the honeycomb structure (2) to act as a transmitted light, projecting a transmitted image (13) by means of the tone of the transmitted light onto the surface on the transmitted light side of the screen (4), picking up the transmitted image (13) projected on the screen (4) by an imaging means (5), and analyzing by an analyzing means (6) the gray level of the obtained image, thereby inspecting for each cell the level of the surface unevenness of the partition and hence enabling the simple inspection on the surface unevenness of the partition of the honeycomb structure (2).</p>
申请公布号 WO2005040773(A1) 申请公布日期 2005.05.06
申请号 WO2004JP16053 申请日期 2004.10.28
申请人 NGK INSULATORS, LTD.;KONDO, TAKAHIRO;AOKI, YOICHI;MIZUTANI, AKIHIRO 发明人 KONDO, TAKAHIRO;AOKI, YOICHI;MIZUTANI, AKIHIRO
分类号 G01B11/30;G01N21/894;G01N21/954;G06T7/00;(IPC1-7):G01N21/84 主分类号 G01B11/30
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