发明名称 Method for manufacturing flash memory device
摘要 The present invention relates to a method for manufacturing a flash memory device. A plurality of conductive layers and dielectric layers are etched in- a single etch apparatus, thus forming a control gate and a floating gate. In a gate formation process in which a thickness of a floating gate is over 1500 Å, problems in short process time and short mass production margin in an existing process can be solved while completely stripping a dielectric layer fence.
申请公布号 US2005095784(A1) 申请公布日期 2005.05.05
申请号 US20040872725 申请日期 2004.06.21
申请人 YANG IN KWON 发明人 YANG IN KWON
分类号 H01L21/8247;G11C16/02;H01L21/308;H01L21/336;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 主分类号 H01L21/8247
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