发明名称 One mask high density capacitor for integrated circuits
摘要 An on-chip decoupling capacitor ( 106 ) and method of fabrication. The decoupling capacitor ( 104 ) is integrated at the top metal interconnect level ( 104 ) and may be implemented with only one additional masking layer. The decoupling capacitor ( 106 ) is formed on a copper interconnect line ( 104 a). An aluminum cap layer ( 118 ) provides electrical connection to the top electrode ( 112 ) of the decoupling capacitor ( 106 ).
申请公布号 US2005093050(A1) 申请公布日期 2005.05.05
申请号 US20030696816 申请日期 2003.10.30
申请人 ROST TIMOTHY A.;BURKE EDMUND;PAPA RAO SATYAVOLU S. 发明人 ROST TIMOTHY A.;BURKE EDMUND;PAPA RAO SATYAVOLU S.
分类号 H01L21/02;H01L23/522;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/02
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