发明名称 |
One mask high density capacitor for integrated circuits |
摘要 |
An on-chip decoupling capacitor ( 106 ) and method of fabrication. The decoupling capacitor ( 104 ) is integrated at the top metal interconnect level ( 104 ) and may be implemented with only one additional masking layer. The decoupling capacitor ( 106 ) is formed on a copper interconnect line ( 104 a). An aluminum cap layer ( 118 ) provides electrical connection to the top electrode ( 112 ) of the decoupling capacitor ( 106 ).
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申请公布号 |
US2005093050(A1) |
申请公布日期 |
2005.05.05 |
申请号 |
US20030696816 |
申请日期 |
2003.10.30 |
申请人 |
ROST TIMOTHY A.;BURKE EDMUND;PAPA RAO SATYAVOLU S. |
发明人 |
ROST TIMOTHY A.;BURKE EDMUND;PAPA RAO SATYAVOLU S. |
分类号 |
H01L21/02;H01L23/522;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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