Semiconductor integrated circuit

摘要

A semiconductor integrated circuit includes: a logic circuit to be tested; a memory connected the logic circuit to be tested; a BIST circuit for testing the memory; and a bypass circuit connected between the memory and the logic circuit and between the memory and the BIST circuit, the bypass circuit has a parallel test path for testing the logic circuit and the memory in parallel, and a signal line test path for testing non-tested signal lines in the parallel test path, and the bypass circuit selectively switches the parallel test path and the signal line test path.