发明名称 System and method for defect free conductor deposition on substrates
摘要 A system and method for depositing a defect-free conductor on semiconductor substrates having features and seed layers with defective regions. A repair layer is deposited over the seed layer and the defective regions in a deposition module within a housing. The repair layer can be deposited by atomic layer deposition or chemical vapor deposition. A conductive material is then electroplated over the seed layer to fill the features and form a defect-free conductive layer over the top surface of the substrate. The electroplating is performed in another deposition module within the housing.
申请公布号 US2005095846(A1) 申请公布日期 2005.05.05
申请号 US20040979341 申请日期 2004.11.01
申请人 BASOL BULENT M. 发明人 BASOL BULENT M.
分类号 H01L21/4763;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/4763
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