发明名称 |
System and method for defect free conductor deposition on substrates |
摘要 |
A system and method for depositing a defect-free conductor on semiconductor substrates having features and seed layers with defective regions. A repair layer is deposited over the seed layer and the defective regions in a deposition module within a housing. The repair layer can be deposited by atomic layer deposition or chemical vapor deposition. A conductive material is then electroplated over the seed layer to fill the features and form a defect-free conductive layer over the top surface of the substrate. The electroplating is performed in another deposition module within the housing.
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申请公布号 |
US2005095846(A1) |
申请公布日期 |
2005.05.05 |
申请号 |
US20040979341 |
申请日期 |
2004.11.01 |
申请人 |
BASOL BULENT M. |
发明人 |
BASOL BULENT M. |
分类号 |
H01L21/4763;H01L21/768;(IPC1-7):H01L21/476 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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