发明名称 Heat-processing method and apparatus for semiconductor process
摘要 A method for subjecting target substrates to a heat process under a vacuum pressure includes a transfer step, heating-up and pressure-reducing step, and heat-processing step. The transfer step is arranged to transfer into a reaction chamber a holder that supports the substrates at intervals. The heating-up and pressure-reducing step following the transfer step is arranged to heat up the reaction chamber to a process temperature, and exhaust the reaction chamber to a process pressure. During the heating-up and pressure-reducing step, the reaction chamber is set at the process pressure after being set at the process temperature, to form a state where the reaction chamber has the process temperature under a pressure higher than the process pressure. The heat-processing step following the heating-up and pressure-reducing step is arranged to subject the substrates to the heat process at the process temperature and process pressure.
申请公布号 US2005095826(A1) 申请公布日期 2005.05.05
申请号 US20040924959 申请日期 2004.08.25
申请人 FUJITA TAKEHIKO;TAMURA AKITAKE;SUZUKI KEISUKE;HASEBE KAZUHIDE;OKADA MITSUHIRO 发明人 FUJITA TAKEHIKO;TAMURA AKITAKE;SUZUKI KEISUKE;HASEBE KAZUHIDE;OKADA MITSUHIRO
分类号 H01L21/324;C23C16/44;C23C16/46;H01L21/00;H01L21/205;(IPC1-7):H01L21/24 主分类号 H01L21/324
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