发明名称 Determining points of maximum deflection of a printed circuit board under test
摘要 A system and method for determining locations of maximum deflection of a printed circuit board (PCB) under test conditioned by boundary and loading conditions of the PCB, first vertical force magnitudes at associated first vertical force locations to be applied to the PCB by a tester fixture in a first direction, and second vertical force magnitudes at associated second vertical force locations to be applied to the PCB by the tester fixture in a second direction. Fixture components may be added to the design to the fixture design and the method iteratively executed until the magnitude of the maximum deflection is less than or equal to a predetermined maximum deflection magnitude.
申请公布号 US2005093552(A1) 申请公布日期 2005.05.05
申请号 US20040983923 申请日期 2004.11.08
申请人 AHRIKENCHEIKH CHERIF 发明人 AHRIKENCHEIKH CHERIF
分类号 G06F17/50;(IPC1-7):G01R31/00 主分类号 G06F17/50
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