发明名称 Noncontact testing of integrated circuits
摘要 In a nondestructive and noncontact analysis system for analyzing and evaluating an object (SW), a light beam generation/modulation apparatus (12) emits a modulated and focused light beam (MLB) to thereby irradiate the object (SW), and the modulation of the modulated and focused light beam is carried out with a modulation signal (MO-S) synchronized with a reference signal (RE-S) composed of a series of regular pulses. A magnetism detection apparatus (22) detects a magnetic field (MF), which is generated by an electric current induced by irradiating the object with the modulated and focused light beam, to thereby produce a magnetic field signal (MF-S). A signal extraction circuit (24) extracts a phase difference signal (PDF-S) between the reference signal (RE-S) and the magnetic field signal (MF-S). An image data production system (Fig. 14) produces phase difference image data (PDFij) based on the phase difference signal (PDF-S). <IMAGE>
申请公布号 EP1528400(A2) 申请公布日期 2005.05.04
申请号 EP20040025339 申请日期 2004.10.25
申请人 NEC ELECTRONICS CORPORATION 发明人 NIKAWA, KIYOSHI
分类号 G01N27/72;G01R31/302;G01R31/311;(IPC1-7):G01R31/302 主分类号 G01N27/72
代理机构 代理人
主权项
地址