发明名称 Chemical mechanical polishing apparatus
摘要 A chemical mechanical polishing (CMP) apparatus includes a plate that holds a substrate, a pad assembly unit comprising a pad support device, a positioning device, and a rotation device operatively connected to the pad assembly unit. The pad support device comprises a plurality of support plates to which pad pieces of a polishing pad can be attached. The positioning device can move at least one of the plurality of support plates in a direction along a surface of the semiconductor substrate to be polished. Further, the CMP apparatus can control the polishing amount along any portion of a surface of a wafer to be polished.
申请公布号 US6887130(B2) 申请公布日期 2005.05.03
申请号 US20040795370 申请日期 2004.03.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JONG-WON;HONG CHANG-KI;KIM HO-YOUNG
分类号 H01L21/304;B24B37/04;B24B41/04;(IPC1-7):B24B49/00 主分类号 H01L21/304
代理机构 代理人
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