APPARATUS FOR TESTING IC PACKAGE,申请号KR20020057062-传众专利搜索

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发明名称	APPARATUS FOR TESTING IC PACKAGE
摘要
申请公布号	KR100486531(B1)	申请公布日期	2005.05.03
申请号	KR20020057062	申请日期	2002.09.18
申请人		发明人
分类号	H05K1/18;G01R31/28;H01L21/66;(IPC1-7):H05K1/18	主分类号	H05K1/18
代理机构		代理人
主权项
地址

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