TIMING GENERATION CIRCUIT FOR SEMICONDUCTOR TEST SYSTEM,申请号KR20000009001-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	TIMING GENERATION CIRCUIT FOR SEMICONDUCTOR TEST SYSTEM
摘要
申请公布号	KR100487050(B1)	申请公布日期	2005.05.03
申请号	KR20000009001	申请日期	2000.02.24
申请人		发明人
分类号	H03K5/05;(IPC1-7):H03K5/05	主分类号	H03K5/05
代理机构		代理人
主权项
地址

您可能感兴趣的专利

ROLLER SEAL FOR ROTARY ENGINE

VERTICAL TEMPERATURE DIFFERENCE PREVENTING STRUCTURE FOR STEAM TURBINE CASING

METHOD AND APPARATUS FOR PRODUCTION OF DIAMOND THIN FILM

SCROLL TYPE HYDRAULIC UNIT

SPEED LIMITER FOR VEHICLE

WARM-UP SYSTEM FOR DIESEL ENGINE

INTERNAL COMBUTION ENGINE

INTAKE SYSTEM FOR INTERNAL COMBUSTION ENGINE

COOLING METHOD FOR TURBINE

STATIONARY BLADE STRUCTURE OF TURBINE

CORRUGATED SLIDING WAY

CHIROPRACTIC DEVICE FOR MASSAGE

SUCTION DUCT FOR VACUUM CLEANER

FLOOR SUCTION TOOL OF VACUUM CLEANER

AFC LOCK DISCRIMINATION CIRCUIT

ANALOG/DIGITAL CONVERTING CIRCUIT

COLOR CATHODE-RAY TUBE DEVICE

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE