发明名称 Dielectric insulation structure for integrating electronic semiconductor devices and relevant manufacturing process
摘要 A dielectric insulation structure is formed in a silicon layer by integrating a dielectric trench structure therein. The dielectric trench structure defines an insulation well where semiconductor devices are to be integrated therein. The dielectric trench structure is on a hollow region that is completely surrounded by a dielectric area. The dielectric area also forms the side insulation of the dielectric trench structure. The dielectric trench structure is interrupted by a plurality of points to define a plurality of side support regions for the insulation well.
申请公布号 US6888213(B2) 申请公布日期 2005.05.03
申请号 US20030444102 申请日期 2003.05.22
申请人 STMICROELECTRONICS S.R.L. 发明人 LEONARDI SALVATORE;MODICA ROBERTO;ARENA GIUSEPPE
分类号 H01L21/762;(IPC1-7):H01L29/06 主分类号 H01L21/762
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