发明名称 Electric circuit arrangement and method for checking the intactness of a photodiode array
摘要 An electric circuit arrangement and method for checking intactness of both a photodiode array and an electrical connection between an array output and a microprocessor input. The array output has a high resistance when the array is inactive and intact. In case of array error, the array output is connected via in each case a defined internal resistance to ground and supply voltages. The circuit arrangement enables at any time an assessment of the status of the connection and, if the connection is intact, enables an assessment of array intactness. This is achieved by connecting the array output via a first test resistor arranged in the spatial vicinity of the array to the ground voltage and by connecting the microprocessor input via a second test resistor arranged in the spatial vicinity of the microprocessor to a microprocessor port output which can be connected either to the ground or supply voltages.
申请公布号 US6888357(B2) 申请公布日期 2005.05.03
申请号 US20030420223 申请日期 2003.04.22
申请人 LEOPOLD KOSTAL GMBH & CO. KG 发明人 BLAESING FRANK;SCHIRP CHRISTIAN
分类号 H01L33/00;H05B33/08;H05B37/03;(IPC1-7):G01R31/04;G01R31/26 主分类号 H01L33/00
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