发明名称 Method of fabricating semiconductor device having gate structure
摘要 An integrated circuit device is formed by forming a gate conductive layer on a gate insulating layer on a substrate. The gate conductive layer and the gate insulating layer are dry-etched to provide a gate structure. A buffer layer is formed on the sidewall of the gate structure covering an interface in the gate structure between the gate conductive layer and the gate insulating layer. The gate structure is annealed, through the buffer layer, to repair damage caused during the dry-etching.
申请公布号 KR100486294(B1) 申请公布日期 2005.04.29
申请号 KR20020087238 申请日期 2002.12.30
申请人 发明人
分类号 H01L21/336;H01L21/28;H01L21/324;H01L29/51 主分类号 H01L21/336
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