发明名称 WAFER BATCH PROCESSING SYSTEM AND METHOD
摘要 A system and method for isothermally distributing a temperature across a semiconductor device. A furnace assembly is provided, which includes a processing tube configured to removably receive a wafer carrier having a full compliment of semiconductor wafers. A heating assembly is provided which can include a resistive heating element positioned to heat air or other gases allowed to enter the process tube. The wafer carrier and heating assembly are vertically raised into a position within the process tube. Once the heating assembly forms a seal with the process tube, the process tube is exhausted and purged of air. Gas is then allowed to flow into the process tube and exchange heat with the heating element. The heated gas circulates through the process tube to convectively raise the temperature of the wafers.
申请公布号 KR20050039837(A) 申请公布日期 2005.04.29
申请号 KR20057001870 申请日期 2005.02.01
申请人 WAFERMASTERS, INCORPORATED 发明人 YOO, WOO SIK
分类号 H01L21/205;C23C16/46;H01L21/00;H01L21/26;H01L21/324;(IPC1-7):H01L21/324 主分类号 H01L21/205
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