发明名称 OPTOELECTRONIC APPARATUS FOR DETECTING DAMAGED GRAIN BY OPERATION OF THE COMBINE-HARVESTER MACHINE
摘要 An optoelectronic apparatus having a measurement region (38) for detecting the presence of damaged or cracked grain kernels in a population of grain kernels which are either in a stationary or moving state at the measurement region. The apparatus comprises a short-wave ultraviolet excitation light source (20) that emits a spectral line of a wavelength shorter than 300 nm, a non-imaging photon detector (22), and wavelength selector such as a dichroic beam-splitter (28) which serves to isolate the fluorescent light emitted in a certain spectral region by the endosperm of grain from the excitation light of the light source, as well as from other sources of light. The apparatus may be mounted in a combine harvester for the purpose of detecting the presence of damaged grain kernels that have endosperm exposed while harvesting.
申请公布号 PL188782(B1) 申请公布日期 2005.04.29
申请号 PL19990345023 申请日期 1999.06.29
申请人 DEERE & CO. 发明人 COOPER WILLIAM F.;SCHAEFER TIMOTHY;MERTINS KARL-HEINZ O.
分类号 A01D41/127;G01N15/06;G01N21/64;G01N21/85 主分类号 A01D41/127
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