发明名称 DISPOSITIF DE MEMOIRE A SEMICONDUCTEUR PRESENTANT UNE STRUCTURE SOI (SILICIUM SUR ISOLANT) ET PROCEDE POUR SA FABRICATION
摘要 <p>A SOI semiconductor device including a substrate, a first gate electrode formed on a first surface of the substrate between a source/drain region, a first insulating layer formed on the first gate electrode and the first surface of the substrate, a capacitor formed on the first insulating layer, electrically connected to the source/drain region, a second insulating layer formed on the capacitor and the first insulating layer, a third insulating layer formed on a second surface of the substrate, a body contact conductor line formed on and through the third insulating layer in alignment with the first gate electrode, electrically connected to the substrate aligned with the first gate electrode between the source/drain region, a fourth insulating layer formed on the body contact conductor line and the third insulating layer, and a bit line formed on the fourth insulating layer, electrically connected to the source/drain region of the substrate.</p>
申请公布号 FR2779273(B1) 申请公布日期 2005.04.29
申请号 FR19990006620 申请日期 1999.05.26
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM YUN GI
分类号 H01L21/28;H01L21/8242;H01L21/84;H01L27/02;H01L27/108;H01L27/12;(IPC1-7):H01L21/84 主分类号 H01L21/28
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