发明名称 |
Scanning interferometry for thin film thickness and surface measurements |
摘要 |
A method including: providing a low coherence scanning interferometry data for at least one spatial location of a sample having multiple interfaces, wherein the data is collected using a low coherence scanning interferometer having an illumination geometry and an illumination frequency spectrum, and wherein the data comprises a low coherence scanning interferometry signal having multiple regions of fringe contrast corresponding to the multiple interfaces; and determining a distance between at least one pair of interfaces based on a distance between the corresponding regions of fringe contrast and information about the illumination geometry.
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申请公布号 |
US2005088663(A1) |
申请公布日期 |
2005.04.28 |
申请号 |
US20040974466 |
申请日期 |
2004.10.27 |
申请人 |
DE GROOT PETER J.;DE LEGA XAVIER C. |
发明人 |
DE GROOT PETER J.;DE LEGA XAVIER C. |
分类号 |
G01B9/02;G01B11/06;G02F1/1333;G02F1/1339;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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